Use of ellipsometry to characterize the surface of HgCdTe | SpringerLinkProtection of Metals. A method of laser ellipsometric diagnostics of corrosion layers on a great number of samples in laboratory and field conditions is presented. A procedure of laser monitoring is proposed and verified; it allows to remotely control the corrosion layer thickness. A highly sensitive return-path double-reflection optical-electrochemical cell is developed. Basic methodological aspects of using a remote-control laser-ellipsometric probe in a flow line for the laser corrosion monitoring in corrosion tests are illustrated by the example of continuous corrosion monitoring of copper—nickel alloy in saline water.
Ellipsometry and polarised light
National Library of Australia. Search the catalogue for collection items held by the National Library of Australia. Azzam, R. Ellipsometry and polarized light. Azzam and N.
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Katharine Hanlon Cross-polarized and parallel-polarized light
Journal of Electronic Materials. Ellipsometry is a sensitive, rapid, and nondestructive optical technique for characterizing materials, especially surfaces and films. By measuring the change in the state of polarization of a light beam reflecting from the sample, one may infer certain characteristics of the sample. We present a review of the applications of ellipsometry to HgCdTe and related materials. The fundamentals of the technique are discussed briefly and the optical parameters at the wavelength A for several materials of interest to infrared technology are listed. Methods and limitations of the analysis of single films, both nonabsorbing and absorbing, are discussed. Examples of an acceptance window for process monitoring are presented.
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